Showing results: 316 - 330 of 405 items found.
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Rotronic Measurement Solutions
The HygroClip2 is a completely new type of probe in a class of it's own in terms of accuracy and performance. Thanks to the new AirChip3000 technology, it also boasts a unique calibration and adjustment process as well as many other superb innovations. At the same time ROTRONIC has taken humidity measurement technology to a whole new level of performance and reliability: the HygroClip2 offers you the best possible reproducibility and a superb system accuracy of < ±0.8 %rh and ±0.1 K.
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Smiths Interconnect
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Konica Minolta Sensing Americas, Inc
Instrument Systems General Accessories current range of optical probes and measurement adapters using fiber optics as a means to transport light in the spectrometer was a primary goal sought by Instrument Systems from the beginning of their product development. With the increased research and the recent advances made in fiber optics it is a goal that has come to fruition. Having striven to incorporate fiber optic technology into their spectrometer systems. Instrument Systems has been working on creating top of the line fiber optic accessories. This not only diversifies the already wide application possibilities for Instrument Systems Spectrometers, but makes them more universally and effortlessly installed. Whether it’s measuring spectral transmission properties in normal light incidence, measuring ultra violet or infrared, or collecting radiation and measurements of irradiance, Instrument Systems has developed an accessory to meet your specific needs. For simplicity and ease of use Instrument Systems has made all of their accessories “plug-and-play”. This means installing and expanding the capabilities of your Instrument Systems Spectrometer has never been easier.
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XP-8500 -
Lorlin Test Systems
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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ThermoWorks
Whether standard or high precision, ThermoWorks handheld meters feature rugged housing and best-in class accuracy across a variety of temperature ranges. Choose from integrated systems or meters that accept multiple probes, single or dual channel meters, alarms or reference models. Perfect for BBQ or sous-vide applications, dairy processing and meat processing, pharmaceutical labs, concrete curing, health departments, and for line checks, critical control point management, and HACCP checklists.
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ThermoWorks
Whether standard or high precision, ThermoWorks handheld meters feature rugged housing and best-in class accuracy across a variety of temperature ranges. Choose from integrated systems or meters that accept multiple probes, single or dual channel meters, alarms or reference models. Perfect for BBQ or sous-vide applications, dairy processing and meat processing, pharmaceutical labs, concrete curing, health departments, and for line checks, critical control point management, and HACCP checklists.
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DL6780 -
Di-Log
Testing of AC/ DC voltages from 12 to 690 V AC/DC Continuity testing with optical and acoustic indication Automatic switching between voltage and continuity Phase rotation test system Single pole phase indication Fully compliant with GS38 Fully operational voltage indication even when batteries are discharged Will not trip any RCD when testing across Live and Earth Single pole detection when L2 probe connected above 100V
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MTI Instruments
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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TK9LIN50 -
Techna-Tool Inc.
BK Mikro Linear is based on the existing design concepts for tool, object and free space monitoring and is modified to utilize a rack and pinion probe instead of a wand. This system monitors a specific distance or depth with longitudinal scanning. This is especially useful in cases where rotary scanning is inappropriateorimpossible. Some examples would be cavities, blind or through holes and places where space is limited. It can also be used to verify a part is in place during assembly or that the proper part is on the machine by probing a specific feature.
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TE6-0706 -
Hangzhou Tonny Electric & Tools Co., Ltd.
*Heavy Duty probe *Heavy plastic handle and insulated ground clip*Testers light up and/or buzz to indicate testing result*Lights for easy visibility.*Heavy duty coil cord or straight cord (optional).*Durably designed for a long service life*For testing 6-12 volt systems for wire breaks, shorts, fuses, lamps, relays, armatures and more.*Suite able for a broad range of household, car, trucks, boats, trailers, vans, motorcycles, industrial and commercial uses.
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SmartSPM -
HORIBA, Ltd.
The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).
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A.H.Systems, Inc.
A.H. Systems offers 10 models of portable antenna kits. Each kit provides all the reliable antennas, current probes and accessories needed to satisfy a wide array of customer requirements. Each component has a specific storage compartment in the carrying case therefore, loss and breakage are virtually eliminated. Cables, a tripod with azimuth and elevation head and a tripod carrying case accompany each antenna kit. Click on a model below to learn more about it''s characteristics and included antennas.
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ProDSS -
YSI Incorporated
Handheld multiparameter instrument with multiple cable options. The YSI ProDSS (digital sampling system) handheld multiparameter meter provides extreme flexibility with two main cable options. Choose between the fully loaded 4-port cable assembly outfitted with any four DSS sensors (with depth or no depth) or the ODO/CT probe and cable - where you get accurate DO measurements every time with an optical dissolved oxygen sensor with an inline conductivity sensor, allowing for real-time salinity compensation.
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Konica Minolta Sensing Americas, Inc
Instrument Systems brings you a selection of exciting turnkey systems for use in evaluating display characteristics. It allows for the easy measurement of different spot sizes due to the variety of interchangeable lenses. Instrument Systems display measurement products are extremely responsive and produce highly precise results. Like many of the Instrument Systems products, they work well in collaboration with each other. These advanced systems are based on several display measurement instruments including the Spectro 320 and CAS140 CT spectroradiometers and our leading telescopic optical probe, the TOP 200. The TOP 200 is primarily used for work in panel graphics and display testings. It measures radiance and luminance intensity, delivering images spots in perfect round shapes, unlike competitor products which are prone to blurring and imperfect elliptical shapes. Instrument Systems can guarantee TOP 200’s low polarization and reproducible results due to their patented mode mixer which is incorporated into the optical fiber connection. No matter what type of display measurements you require, Instrument Systems can provide a setup that goes beyond your expectations.
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Model 2180 -
Magnetic Instrumentation Inc.
The unit is compact and lightweight. The basic system is 7″ wide by 2.5″ high and 12″ long. When measurements are needed below approximately 100 micro-ohm-centimeters, the basic system is piggybacked onto a second enclosure that houses a power amplifier with a current gain of ten. The combined unit measures 7″ wide by 5″ high and 12″ long. The combined unit weighs 11.5 pounds. Two short cables interconnect the two enclosures for powering the power amplifier and routing the signals to the fixture or four point probe. The front panel of the basic system includes a 32-character backlit LCD display and a set of function keys. An easy-to-use menu will allow access to user defined parameters such as sample thickness, sample volume, and calibration constants; upper and lower alarm limits, relative measurements, and several others.
